
Advances in Imaging and Electron Physics
Peter W. Hawkes
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Aberration-Corrected Electron Microscopy
Academic Pr · 2008
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Published by Academic Pr in 2008, Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy by Peter W. Hawkes runs to 538 pages.
Its main subjects are Optical data processing, Optoelectronic devices, Electron optics and Particle beams.