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Cover of Advances in Imaging and Electron Physics

Advances in Imaging and Electron Physics

Aberration-Corrected Electron Microscopy

by Peter W. Hawkes

Academic Pr · 2008

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About this book

Published by Academic Pr in 2008, Advances in Imaging and Electron Physics: Aberration-Corrected Electron Microscopy by Peter W. Hawkes runs to 538 pages.

Its main subjects are Optical data processing, Optoelectronic devices, Electron optics and Particle beams.

Book details

ISBN-13
9780123742209
ISBN-10
012374220X
Author
Peter W. Hawkes
Publisher
Academic Pr
Published
2008
Edition
1
Pages
538
Language
English
Condition
New
Subject
Electrons
See all