Advances in Imaging and Electron Physics

Name: Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement
Brand: Academic Pr
SKU: 9780123942982
Price: 14003.00 INR
Availability: InStock

Silicon-Based Millimeter-Wave Technology Measurement

by Jamal Deen

Academic Pr · 2012

₹14,003

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About this book

Advances in Imaging and Electron Physics: Silicon-Based Millimeter-Wave Technology Measurement by Jamal Deen is a 483-page book published by Academic Pr in 2012.

Its main subjects are Integrated circuits, Silicon and Microwave communication systems.