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Cover of Monte Carlo Modeling for Electron Microscopy and Microanalysis

Monte Carlo Modeling for Electron Microscopy and Microanalysis

by David C. Joy

Oxford University Press

₹4,429

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From the publisher

This book describes for the first time how Monte Carlo modeling methods can be applied to electron microscopy and microanalysis. Computer programs for two basic types of Monte Carlo simulation are developed from physical models of the electron scattering process--a single scattering program capable of high accuracy but requiring long computation times, and a plural scattering program which is less accurate but much more rapid.

Description supplied by the publisher.

Book details

ISBN-13
9780195088748
ISBN-10
0195088743
Author
David C. Joy
Condition
New
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