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Cover of New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices

New Approaches to Image Processing Based Failure Analysis of Nano-Scale ULSI Devices

by Pavel Livshits, Zeev Zalevsky, Eran Gur

William Andrew Pub · 2013

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About this book

Topics covered include Image processing, Nanotechnology, Computers and IT and Ultra large scale integration.

Book details

ISBN-13
9780323241434
ISBN-10
0323241433
Authors
Pavel Livshits, Zeev Zalevsky, Eran Gur
Publisher
William Andrew Pub
Published
2013
Edition
Illustrated
Pages
101
Language
English
Condition
New
Subject
ICs & Chip Design

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