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Cover of Characterization, Testing, Measurement, and Metrology

Characterization, Testing, Measurement, and Metrology

by Chander Prakash, Sunpreet Singh, J. Paulo Davim

CRC Press · 2020

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About this book

Published by CRC Press in 2020, Characterization, Testing, Measurement, and Metrology by Chander Prakash, Sunpreet Singh & others runs to 192 pages.

Its main subjects are Materials, Testing, Matériaux and Essais.

Book details

ISBN-13
9780367275150
ISBN-10
0367275155
Authors
Chander Prakash, Sunpreet Singh, J. Paulo Davim
Publisher
CRC Press
Published
2020
Edition
1
Pages
192
Language
English
Condition
New
See all