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Cover of Advanced VLSI Design and Testability Issues

Advanced VLSI Design and Testability Issues

by Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra

CRC Press · 2020

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About this book

Advanced VLSI Design and Testability Issues by Suman Lata Tripathi, Sobhit Saxena & others is a 360-page book published by CRC Press in 2020.

Topics covered include Integrated circuits, Very large scale integration, Design and construction and Electricity.

Book details

ISBN-13
9780367492823
ISBN-10
0367492822
Authors
Suman Lata Tripathi, Sobhit Saxena, Sushanta Kumar Mohapatra
Publisher
CRC Press
Published
2020
Edition
1
Pages
360
Language
English
Condition
New
Subject
Electricity

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