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Cover of Data Mining and Diagnosing Ic Fails

Data Mining and Diagnosing Ic Fails

by Leendert M. Huisman

Springer-Verlag New York Inc. · 2005

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About this book

Data Mining and Diagnosing Ic Fails is written by Leendert M. Huisman. This edition is published by Springer-Verlag New York Inc. (2005).

Its main subjects are Statistical methods, Data mining, Failures and Semiconductors.

Book details

ISBN-13
9780387249933
ISBN-10
0387249931
Author
Leendert M. Huisman
Publisher
Springer-Verlag New York Inc.
Published
2005
Edition
2005 ed.
Pages
250
Language
English
Condition
New
Subject
Semiconductor Devices

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