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Cover of Physical Principles of Electron Microscopy

Physical Principles of Electron Microscopy

An Introduction to Tem, Sem, and Aem

by R. F. Egerton

Springer

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From the publisher

Scanning and stationary-beam electron microscopes have become indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences.

Description supplied by the publisher.

Book details

ISBN-13
9780387258003
ISBN-10
0387258000
Author
R. F. Egerton
Publisher
Springer
Condition
New
See all