Electron Energy-Loss Spectroscopy in the Electron Microscope
R. F. Egerton
₹30,421
Physical Principles of Electron Microscopy
An Introduction to TEM, SEM, and AEM
Springer · 2007
₹5,045
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About this book
Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM by R. F.
Topics covered include Electron microscopy.
Book details
- ISBN-13
- 9780387258003
- ISBN-10
- 0387258000
- Author
- R. F. Egerton
- Publisher
- Springer
- Published
- 2007
- Pages
- 214
- Language
- English
- Condition
- New
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