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Cover of Scanning Probe Microscopy

Scanning Probe Microscopy

Atomic Scale Engineering by Forces and Currents

by Adam Foster, Werner A. Hofer

Springer · 2006

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About this book

Published by Springer in 2006, Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents by Adam Foster & Werner A. Hofer runs to 281 pages.

The book deals with Scanning probe microscopy and Scanning electron microscopy.

Book details

ISBN-13
9780387400907
ISBN-10
0387400907
Authors
Adam Foster, Werner A. Hofer
Publisher
Springer
Published
2006
Pages
281
Language
English
Condition
New
See all