
Geometric Integration Theory
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Test, Defect Tolerance, and Reliability: 37
Springer Verlag · 2008
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability: 37 by Mohammad H. Tehranipoor is a 405-page book published by Springer Verlag in 2008.
Its main subjects are Nanotechnology, Microtechnology and High technology.
About the author: Mohammad H. Tehranipoor (born 1974).