Internal Photoemission Spectroscopy
Valeri V. Afanas'ev
₹11,482
Failure Analysis of Integrated Circuits
Tools and Techniques: 494
Springer · 1999
₹7,541
Free delivery. Nothing extra to pay at checkout.
- Delivery in 3–7 days to any serviceable pincode in India, with tracking.
- Cash on delivery. Pay when the parcel reaches you.
- 15-day returns. See what qualifies.
About this book
Failure Analysis of Integrated Circuits: Tools and Techniques: 494 is written by Lawrence C. Wagner. This edition from Springer (1999) has 255 pages.
The book deals with Failures, Semiconductors, Reliability and Testing.
Book details
- ISBN-13
- 9780412145612
- ISBN-10
- 0412145618
- Author
- Lawrence C. Wagner
- Publisher
- Springer
- Published
- 1999
- Edition
- 1999 ed.
- Pages
- 255
- Language
- English
- Condition
- New
- Subject
- Semiconductors
More in Semiconductors
Physical Models of Semiconductor Quantum Devices
Ying Fu, M. Willander
₹2,978
Organic Thin-Film Transistor Applications
Brajesh Kumar Kaushik, Brijesh Kumar, Sanjay Prajapati, Poornima Mittal
₹10,513
Electronic Devices and Circuits
David A. Bell
₹4,256
III-Nitride Ultraviolet Emitters
Michael Kneissl, Jens Rass
₹12,323
Recent Trends in Thermoelectric Materials Research
Terry Tritt
₹21,136
Solid State Electronic Devices
D.K. Bhattacharya, Amp, Rajnish Sharma
₹5,689
Understanding smart sensors
Randy Frank
₹2,888
Semiconductor Sensors in Physico-Chemical Studies
L. Yu Kupriyanov
₹11,858
Nonlinear Optics in Solids
Ole Keller
₹7,729
Properties of Synthetic Two-Dimensional Materials and Heterostructures
Yu-Chuan Lin
₹7,735
Semi-Insulating Gas (v. 20)
R. K. Willardson
₹3,575