Semiconductor Materials Analysis and Fabrication Process Control

Name: Semiconductor Materials Analysis and Fabrication Process Control: Proceedings of Symposium D on Diagnostic Techniques for Semiconductor
Brand: Elsevier Science Ltd
SKU: 9780444899088
Price: 2742.00 INR
Availability: InStock

Proceedings of Symposium D on Diagnostic Techniques for Semiconductor

by G. M. Crean, R. Stuck

Elsevier Science Ltd · 1992

₹2,742

Free delivery. Nothing extra to pay at checkout.

Delivery in 3–7 days to any serviceable pincode in India, with tracking.
Cash on delivery. Pay when the parcel reaches you.
15-day returns. See what qualifies.

About this book

Semiconductor Materials Analysis and Fabrication Process Control: Proceedings of Symposium D on Diagnostic Techniques for Semiconductor by G. M. Crean & R. Stuck is a 356-page book published by Elsevier Science Ltd in 1992. It belongs to the European materials research society symposia proceedings series.

The book deals with Optical properties, Semiconductors, Quality control and Congresses.