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Cover of Transient–Induced Latchup in CMOS Integrated Circuits

Transient–Induced Latchup in CMOS Integrated Circuits

by Sheng–Fu Hsu, Ming–Dou Ker

Wiley–Blackwell · 2009

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About this book

Transient–Induced Latchup in CMOS Integrated Circuits by Sheng–Fu Hsu & Ming–Dou Ker is a 272-page book published by Wiley–Blackwell in 2009.

Its main subjects are Complementary Metal oxide semiconductors, Defects, Reliability and Transients (Electricity).

Book details

ISBN-13
9780470824078
ISBN-10
0470824077
Authors
Sheng–Fu Hsu, Ming–Dou Ker
Published
2009
Pages
272
Language
English
Condition
New

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