
Research into Practice - Reality and Gaps
George Heineman, Jan Kofron, Frantisek Plasil
₹5,508

by Sheng–Fu Hsu, Ming–Dou Ker
Wiley–Blackwell · 2009
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Transient–Induced Latchup in CMOS Integrated Circuits by Sheng–Fu Hsu & Ming–Dou Ker is a 272-page book published by Wiley–Blackwell in 2009.
Its main subjects are Complementary Metal oxide semiconductors, Defects, Reliability and Transients (Electricity).