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Jay Lee, Thomas W. Cleare, Mary Russell
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Statistical Analysis with ArcView GIS®
by Jay Lee, David W. S. Wong
John Wiley & Sons · 2001
₹4,001
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About this book
Published by John Wiley & Sons in 2001, Statistical Analysis with ArcView GIS® by Jay Lee & David W. S. Wong runs to 208 pages.
Its main subjects are Statistics, ArcView, Geographic information systems and Remote Sensing & Geographic Information Systems.
Book details
- ISBN-13
- 9780471348740
- ISBN-10
- 0471348740
- Authors
- Jay Lee, David W. S. Wong
- Publisher
- John Wiley & Sons
- Published
- 2001
- Pages
- 208
- Language
- English
- Condition
- New
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