Surface Analysis of Polymers by XPS and Static Sims

Name: Surface Analysis of Polymers by XPS and Static Sims
Brand: Cambridge University Press
SKU: 9780521017534
Price: 4483.00 INR
Availability: InStock

by D. Briggs, D. R. Clarke, S. Suresh

Cambridge University Press

₹4,483

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From the publisher

This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving.

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