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Cover of Atom-Probe Field Ion Microscopy

Atom-Probe Field Ion Microscopy

by Tien T. Tsong

Cambridge University Press

₹5,179

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From the publisher

Atom-probe field ion microscopy is currently the only technique capable of imaging solid surfaces with atomic resolution, and at the same time of chemically analyzing surface atoms selected by the observer from the field ion image.

Description supplied by the publisher.

Book details

ISBN-13
9780521019934
ISBN-10
0521019931
Author
Tien T. Tsong
Condition
New
See all