Reflection Electron Microscopy and Spectroscopy for Surface Analysis
Zhong Lin Wang, Wang Zhong Lin
₹5,152
Reflection Electron Microscopy and Spectroscopy for Surface Analysis
₹4,380
Free delivery. Nothing extra to pay at checkout.
- New copy. Each book is ordered new from our distributor, Atlantic Books, after you place your order.
- Delivery in 3–7 days to any serviceable pincode in India, with tracking.
- Cash on delivery. Pay when the parcel reaches you.
- 15-day returns. See what qualifies.
From the publisher
This book is a comprehensive review of the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS). The book is divided into three parts: diffraction, imaging and spectroscopy.
Description supplied by the publisher.
Book details
- ISBN-13
- 9780521482660
- ISBN-10
- 0521482666
- Author
- Zhong Lin Wang
- Publisher
- Cambridge University Press
- Condition
- New
More by Zhong Lin Wang and related titles
The Genealogy of Aesthetics
Ekbert Faas
₹4,217
Higher Dimensional Algebraic Geometry
Christopher Hacon, Chenyang Xu
₹4,970
Communicating in Science
Vernon Booth, Booth, Booth Vernon
₹5,253
Conquest in Cyberspace
Martin C. Libicki
₹3,959
Durkheim's Philosophy Lectures
Emile Durkheim, Neil Gross, Robert Alun Jones
₹4,670
Karl Popper
Anthony O'Hear
₹4,359
Literature, Education, and Romanticism
Alan Richardson, James Chandler, Marilyn Butler
₹4,782
Giacomo Puccini
Mosco Carner
₹2,411
The Logarithmic Integral
Paul Koosis, Koosis Paul
₹5,063
Successful Science Communication
David J. Bennett, Richard C. Jennings
₹5,377
Admissible Sets and Structures
Jon Barwise
₹4,505