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Cover of Characterization of High Tc Materials and Devices by Electron Microscopy

Characterization of High Tc Materials and Devices by Electron Microscopy

Cambridge University Press · 2000 · Hardcover

₹6,083

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About this book

Topics covered include Electron microscopy, Technique, High temperature superconductors and Condensed matter physics (liquids & solids).

Book details

ISBN-13
9780521554909
ISBN-10
052155490X
Publisher
Cambridge University Press
Published
2000
Edition
Illustrated
Binding
Hardcover
Pages
406
Language
English
Condition
New
Subject
Optics

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