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Cover of Nonlinear Transistor Model Parameter Extraction Techniques

Nonlinear Transistor Model Parameter Extraction Techniques

by Matthias Rudolph, Christian Fager, David E. Root

Cambridge University Press

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From the publisher

Achieve accurate and reliable parameter extraction using this complete survey of state-of-the-art techniques and methods. A team of experts from industry and academia provides you with insights into a range of key topics, including parasitics, intrinsic extraction, statistics, extraction uncertainty, nonlinear and DC parameters, self-heating and traps, noise, and package effects.

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Book details

ISBN-13
9780521762106
ISBN-10
0521762103
Authors
Matthias Rudolph, Christian Fager, David E. Root
Condition
New
See all