Focused Ion Beam Systems

Name: Focused Ion Beam Systems: Basics and Applications
Brand: Cambridge University Press
SKU: 9780521831994
Price: 4004.00 INR
Availability: InStock

Basics and Applications

by Nan Yao

Cambridge University Press

₹4,004

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From the publisher

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool.

Description supplied by the publisher.