Active Carbon
Etc, Jerzy Choma, Andrzej Swiatkowski, Helena Jankowska
₹4,114
Computed Electron Micrographs and Defect Identification
by Etc, A.K Head
Elsevier Science Publishing Co Inc.,U.S. · 1973
₹3,824
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About this book
Computed Electron Micrographs and Defect Identification by Etc & A.K Head is a 406-page book published by Elsevier Science Publishing Co Inc.,U.S. in 1973.
Book details
- ISBN-13
- 9780720417579
- ISBN-10
- 0720417570
- Authors
- Etc, A.K Head
- Published
- 1973
- Pages
- 406
- Language
- English
- Condition
- New
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