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Cover of Semiconductor Memories

Semiconductor Memories

Technology, Testing, and Reliability

by Ashok K. Sharma, Rochit Rajsuman

IEEE · 2002 · Hardcover

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About this book

Published by IEEE in 2002, Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma & Rochit Rajsuman runs to 462 pages in hardcover. The work was first published in 1997.

Its main subjects are Semiconductor storage devices, Semiconductors, Storage media & peripherals and Technology & Industrial Arts.

Book details

ISBN-13
9780780310001
ISBN-10
0780310004
Authors
Ashok K. Sharma, Rochit Rajsuman
Publisher
IEEE
Published
2002
First published
1997
Edition
1
Binding
Hardcover
Pages
462
Language
English
Condition
New
See all