
Design of Water Supply Pipe Networks
Ashok K. Sharma, Prabhata K. Swamee
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Technology, Testing, and Reliability
by Ashok K. Sharma, Rochit Rajsuman
IEEE · 2002 · Hardcover
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Published by IEEE in 2002, Semiconductor Memories: Technology, Testing, and Reliability by Ashok K. Sharma & Rochit Rajsuman runs to 462 pages in hardcover. The work was first published in 1997.
Its main subjects are Semiconductor storage devices, Semiconductors, Storage media & peripherals and Technology & Industrial Arts.