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Cover of Digital Systems Testing and Testable Design

Digital Systems Testing and Testable Design

by Melvin A. Breuer, Arthur D. Friedman, Miron Abramovici

Wiley-IEEE Press · 1994

₹13,622

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About this book

Digital Systems Testing and Testable Design by Melvin A. Breuer, Arthur D. Friedman & others is a 672-page book published by Wiley-IEEE Press in 1994.

Its main subjects are Circuitos integrados, Design and construction, Digital integrated circuits and Testing.

Book details

ISBN-13
9780780310629
ISBN-10
0780310624
Authors
Melvin A. Breuer, Arthur D. Friedman, Miron Abramovici
Publisher
Wiley-IEEE Press
Published
1994
Edition
Revised
Pages
672
Language
English
Condition
New
Subject
Sciences, Technology & Medicine

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