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Cover of Gate Dielectric Integrity

Gate Dielectric Integrity

Material

by D. C. Gupta

American Society for Testing & Materials · 2000 · Paperback

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About this book

Gate Dielectric Integrity: Material by D. C. Gupta is a 176-page paperback edition published by American Society for Testing & Materials in 2000.

The book deals with Wafer-scale integration, Dielectrics, Semiconductor wafers and Testing.

Book details

ISBN-13
9780803126152
ISBN-10
0803126158
Author
D. C. Gupta
Publisher
American Society for Testing & Materials
Published
2000
Binding
Paperback
Pages
176
Language
English
Condition
New
Subject
Materials

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