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Cover of High Resolution X-Ray Diffractometry and Topography

High Resolution X-Ray Diffractometry and Topography

by D.K Bowen, Brian K. Tanner

CRC Press · 1998

₹17,092

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About this book

High Resolution X-Ray Diffractometry and Topography by D.K Bowen & Brian K. Tanner is a 262-page book published by CRC Press in 1998.

Topics covered include X-rays, Diffraction, X-ray crystallography and Crystals.

About the author: D. Keith Bowen (born 1940).

Book details

ISBN-13
9780850667585
ISBN-10
0850667585
Authors
D.K Bowen, Brian K. Tanner
Publisher
CRC Press
Author dates
D. Keith Bowen (born 1940)
Published
1998
Edition
1
Pages
262
Language
English
Condition
New
Subject
Sciences, Technology & Medicine

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