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Electromigration in Metals
Fundamentals to Nano-Interconnects
by Paul S. Ho, Chao-Kun Hu, Valeriy Sukharev, Martin Gall
Cambridge University Press · 2022
₹10,083
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About this book
Electromigration in Metals: Fundamentals to Nano-Interconnects is written by Paul S. Ho, Chao-Kun Hu & others. This edition from Cambridge University Press (2022) has 430 pages.
Book details
- ISBN-13
- 9781107032385
- ISBN-10
- 1107032385
- Authors
- Paul S. Ho, Chao-Kun Hu, Valeriy Sukharev, Martin Gall
- Publisher
- Cambridge University Press
- Published
- 2022
- Pages
- 430
- Language
- English
- Condition
- New
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