
Dependability in Electronic Systems
Eishi H. Ibe, Yutaka Uematsu, Takashi Suga, Nobuyasu Kanekawa
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by Eishi H. Ibe
IEEE · 2014
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Published by IEEE in 2014, Terrestrial Radiation Effects in ULSI Devices and Electronic Systems by Eishi H.
The book deals with Environmental protection, Electronic circuits, Effect of radiation on and Integrated circuits.