Thermal-Aware Testing of Digital VLSI Circuits and Systems
Santanu Chattopadhyay
₹4,311
Thermal-Aware Testing of Digital VLSI Circuits and Systems
CRC Press · 2018
₹4,932
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About this book
Thermal-Aware Testing of Digital VLSI Circuits and Systems is written by Santanu Chattopadhyay. This edition is published by CRC Press (2018).
Its main subjects are Digital integrated circuits, Temperature measurements, Integrated circuits and Very large scale integration.
Book details
- ISBN-13
- 9781351227773
- ISBN-10
- 1351227777
- Author
- Santanu Chattopadhyay
- Publisher
- CRC Press
- Published
- 2018
- Pages
- 118
- Language
- English
- Condition
- New
- Subject
- Mechanical
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