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High Performance Memory Testing
Design Principles, Fault Modeling and Self-Test: 22
Kluwer Academic Pub · 2002 · Hardcover
₹4,095
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About this book
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test: 22 is written by R. Dean Adams. This hardcover edition from Kluwer Academic Pub (2002) has 264 pages. It belongs to the Frontiers in electronic testing series.
Its main subjects are Computer storage devices, Semiconductor storage devices, Testing and Circuits & components.
Book details
- ISBN-13
- 9781402072550
- ISBN-10
- 1402072554
- Author
- R. Dean Adams
- Publisher
- Kluwer Academic Pub
- Published
- 2002
- Series
- Frontiers in electronic testing
- Edition
- 2003 ed.
- Binding
- Hardcover
- Pages
- 264
- Language
- English
- Condition
- New
- Subject
- Computer architecture
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