Charter Schools – Hope or Hype?
Jack Buckley, Mark Schneider
₹4,444
Measuring Success – Testing, Grades, and the Future of College Admissions
by Jack Buckley, Ben Wildavsky, Lynn Letukas
Johns Hopkins University Press · 2018 · Hardcover
₹4,435
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About this book
Topics covered include Universities and colleges, Entrance examinations and Validity.
Book details
- ISBN-13
- 9781421424965
- ISBN-10
- 1421424967
- Authors
- Jack Buckley, Ben Wildavsky, Lynn Letukas
- Publisher
- Johns Hopkins University Press
- Published
- 2018
- Binding
- Hardcover
- Pages
- 344
- Language
- English
- Condition
- New
- Subject
- Universities and colleges
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