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Cover of Yield Simulation for Integrated Circuits

Yield Simulation for Integrated Circuits

33

by D.M Walker

Springer-Verlag New York Inc. · 2010

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About this book

Yield Simulation for Integrated Circuits: 33 by D.M Walker is a 209-page book published by Springer-Verlag New York Inc. in 2010.

The book deals with Computer engineering, Computer-aided design, Computer science and Monte carlo method.

Book details

ISBN-13
9781441952011
ISBN-10
1441952012
Author
D.M Walker
Publisher
Springer-Verlag New York Inc.
Published
2010
Edition
Softcover reprint of hardcover 1st ed. 1987
Pages
209
Language
English
Condition
New
Subject
Computer-aided design

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