Principles of Chemical Vapor Deposition
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Thermal Testing of Integrated Circuits
by J. Altet, Antonio Rubio
Springer-Verlag New York Inc. · 2011
₹7,763
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About this book
Thermal Testing of Integrated Circuits is written by J. Altet & Antonio Rubio. This edition from Springer-Verlag New York Inc. (2011) has 204 pages.
Its main subjects are Systems engineering, Computer engineering, Engineering and Machinery.
Book details
- ISBN-13
- 9781441952875
- ISBN-10
- 144195287X
- Authors
- J. Altet, Antonio Rubio
- Publisher
- Springer-Verlag New York Inc.
- Published
- 2011
- Edition
- Softcover reprint of the original 1st ed. 2002
- Pages
- 204
- Language
- English
- Condition
- New
- Subject
- Machinery
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