Testing Static Random Access Memories

Name: Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26
Brand: Springer Nature
SKU: 9781441954305
Price: 7739.00 INR
Availability: InStock

Defects, Fault Models and Test Patterns: 26

by Said Hamdioui

Springer Nature · 2010 · Paperback

₹7,739

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About this book

Published by Springer Nature in 2010, Testing Static Random Access Memories: Defects, Fault Models and Test Patterns: 26 by Said Hamdioui runs to 240 pages in paperback.

Topics covered include Random access memory, Testing and Computer storage devices.