Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces

Name: Atomic Scale Characterization and First-Principles Studies of Si₃n₄ Interfaces
Brand: Springer
SKU: 9781441978165
Price: 4720.00 INR
Availability: InStock

by Weronika Walkosz

Springer

₹4,720

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From the publisher

This thesis presents results from a combined atomic-resolution Z-contrast and annular bright-field imaging and electron energy loss spectroscopy in the Scanning Transmission Electron Microscopy, as well as first principles studies of the interfaces between crystalline β - Si 3 N 4 and amorphous (i) CeO2-x as well as (ii) SiO2 intergranular film (IGF).

Description supplied by the publisher.