Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces

Name: Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
Brand: ‎ Springer-Verlag New York Inc.
SKU: 9781441978165
Price: 4720.00 INR
Availability: InStock

by Weronika Walkosz

‎ Springer-Verlag New York Inc. · 2011

₹4,720

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About this book

Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces is written by Weronika Walkosz. This edition from ‎ Springer-Verlag New York Inc. (2011). It belongs to the Springer Theses series.

The book deals with Physical organic chemistry, Materials, Microreactors and Ceramic materials.