
The Physics of Low-Dimensional Semiconductors
John H. Davies, J. H. Davies
₹5,436

by Sleiman Bou-Sleiman, Mohammed Ismail
Free delivery. Nothing extra to pay at checkout.
This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).
Description supplied by the publisher.