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Cover of Built-In-Self-Test and Digital Self-Calibration for RF Socs

Built-In-Self-Test and Digital Self-Calibration for RF Socs

by Sleiman Bou-Sleiman, Mohammed Ismail

Springer

₹5,487

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From the publisher

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs).

Description supplied by the publisher.

Book details

ISBN-13
9781441995476
ISBN-10
1441995471
Authors
Sleiman Bou-Sleiman, Mohammed Ismail
Publisher
Springer
Condition
New

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