
Micro and Nanophotonics for Semiconductor Infrared Detectors
Zoran Jakic
₹5,314

Moving Away from the Trial and Error Approach
by Tomi Laurila, Vesa Vuorinen, Toni T. Mattila, Jorma Kivilahti, Markus Turunen, Mervi Paulasto-Kröckel
Springer London Ltd · 2012
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Published by Springer London Ltd in 2012, Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach by Tomi Laurila, Vesa Vuorinen & others runs to 218 pages.
Its main subjects are Integrated circuits and Microelectronics.