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Interfacial Compatibility in Microelectronics

Moving Away from the Trial and Error Approach

by Tomi Laurila, Vesa Vuorinen, Toni T. Mattila, Jorma Kivilahti, Markus Turunen, Mervi Paulasto-Kröckel

Springer London Ltd · 2012

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About this book

Published by Springer London Ltd in 2012, Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach by Tomi Laurila, Vesa Vuorinen & others runs to 218 pages.

Its main subjects are Integrated circuits and Microelectronics.

Book details

ISBN-13
9781447124696
ISBN-10
1447124693
Authors
Tomi Laurila, Vesa Vuorinen, Toni T. Mattila, Jorma Kivilahti, Markus Turunen, Mervi Paulasto-Kröckel
Published
2012
Edition
2012
Pages
218
Language
English
Condition
New

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