Fundamental Principles of Engineering Nanometrology
Richard Leach
₹1,652
Fundamental Principles of Engineering Nanometrology
William Andrew Pub · 2014
₹10,429
Free delivery. Nothing extra to pay at checkout.
- Delivery in 3–5 days to any serviceable pincode in India, with tracking.
- Cash on delivery. Pay when the parcel reaches you.
- 15-day returns.
- Express shipping. Same-day dispatch (Monday to Saturday), delivered all over India in 3–5 days.
Offer
Use code GIG9 at checkout and pay ₹9,929 for this book (save ₹500).
9% off every book, up to ₹500 off per order.
About this book
The book deals with Measurement, Nanotechnology, Microtechnology and Metrology.
Book details
- ISBN-13
- 9781455777532
- ISBN-10
- 1455777536
- Author
- Richard Leach
- Publisher
- William Andrew Pub
- Published
- 2014
- Edition
- 2
- Pages
- 361
- Language
- English
- Condition
- New
- Subject
- Measurement
More by Richard Leach and related titles
Advances in Optical Surface Texture Metrology
Richard Leach
₹14,619
Optical Measurement of Surface Topography
Richard Leach
₹5,157
Atmospheric Deposition
J.W Erisman, G.P.J Draaijers
₹2,848
The Freja Mission
Rickard Lundin
₹7,727
Unbiased Stereology
Vyvyan Howard, Matthew Reed
₹2,736
CESMM3 Civil Engineering Standard Method of Measurement
S. Luria A.R. Vygo
₹2,169
Photodetection and Measurement
Mark Johnson
₹5,432
Recommended procedures for measuring the productivity of plankton standing stock and related oceanic properties
National Research Council (U.S.). Committee on Oceanography. Biological Methods Panel.
₹3,214
Test and Measurement
Jon S. Wilson
₹4,017
Mathematische Methoden Der Schallortung in Der Atmosphäre
Kurt Nixdorff
₹3,623
Measurement and Representation of Sensations
Hans Colonius, Ehtibar N. Dzhafarov
₹5,217