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Cover of Rapid Reliability Assessment of VLSICs

Rapid Reliability Assessment of VLSICs

by B.K Jones, Y.Z Xu, A. Richardson, A.P Dorey

Springer-Verlag New York Inc. · 2012

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About this book

Rapid Reliability Assessment of VLSICs is written by B.K Jones, Y.Z Xu & others. This edition is published by Springer-Verlag New York Inc. (2012).

Its main subjects are Engineering, Computer engineering and Optical materials.

Book details

ISBN-13
9781461278795
ISBN-10
1461278791
Authors
B.K Jones, Y.Z Xu, A. Richardson, A.P Dorey
Publisher
Springer-Verlag New York Inc.
Published
2012
Edition
Softcover reprint of the original 1st ed. 1990
Pages
212
Language
English
Condition
New
Subject
Computer engineering

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