Trends in Computer Aided Innovation
Leon-rovira N.
₹1,947
From Contamination to Defects, Faults and Yield Loss
Simulation and Applications: 5
by Jitendra B. Khare, Wojciech Maly
Springer-Verlag New York Inc. · 2011
₹7,738
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About this book
From Contamination to Defects, Faults and Yield Loss: Simulation and Applications: 5 by Jitendra B.in 2011.
Topics covered include Systems engineering, Engineering, Computer-aided design and Computer engineering.
Book details
- ISBN-13
- 9781461285953
- ISBN-10
- 146128595X
- Authors
- Jitendra B. Khare, Wojciech Maly
- Publisher
- Springer-Verlag New York Inc.
- Published
- 2011
- Edition
- Softcover reprint of the original 1st ed. 1996
- Pages
- 150
- Language
- English
- Condition
- New
- Subject
- CAD & Design Software
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