
Large-Scale Scientific Computing
Ivan Lirkov, Svetozar D. Margenov, Jerzy Wasniewski
₹5,737

157
by Kenneth M. Butler, M. Ray Mercer
Springer-Nature New York Inc · 2012
Free delivery. Nothing extra to pay at checkout.
Published by Springer-Nature New York Inc in 2012, Assessing Fault Model and Test Quality: 157 by Kenneth M. Butler & M. Ray Mercer runs to 132 pages.
The book deals with Computer engineering, Computer-aided design and Computer science.