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Cover of Atom Probe Tomography

Atom Probe Tomography

Analysis at the Atomic Level

by Michael K. Miller

Springer-Verlag New York Inc. · 2012

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About this book

Published by Springer-Verlag New York Inc. in 2012, Atom Probe Tomography: Analysis at the Atomic Level by Michael K. Miller runs to 239 pages.

Its main subjects are Surfaces (Physics), Materials, Tomography and Microscopy.

About the author: M. K. Miller (born 1958).

Book details

ISBN-13
9781461369219
ISBN-10
1461369215
Author
Michael K. Miller
Author dates
M. K. Miller (born 1958)
Published
2012
Edition
Softcover reprint of the original 1st ed. 2000
Pages
239
Language
English
Condition
New
Subject
Surfaces
See all