
Atom Probe Tomography
Michael K. Miller, Richard G. Forbes
₹3,857

Analysis at the Atomic Level
Springer-Verlag New York Inc. · 2012
Free delivery. Nothing extra to pay at checkout.
Published by Springer-Verlag New York Inc. in 2012, Atom Probe Tomography: Analysis at the Atomic Level by Michael K. Miller runs to 239 pages.
Its main subjects are Surfaces (Physics), Materials, Tomography and Microscopy.
About the author: M. K. Miller (born 1958).