Intermetallic Compounds
J. H. Westbrook, R. L. Fleischer
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Quantitative X-Ray Diffractometry
by Lev S. Zevin, Giora Kimmel
Springer-Verlag New York Inc. · 2011
₹7,736
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About this book
Quantitative X-Ray Diffractometry by Lev S. Zevin & Giora Kimmel is a 372-page book published by Springer-Verlag New York Inc. in 2011.
Topics covered include Crystallography and Physics.
Subjects
Book details
- ISBN-13
- 9781461395379
- ISBN-10
- 1461395372
- Authors
- Lev S. Zevin, Giora Kimmel
- Publisher
- Springer-Verlag New York Inc.
- Published
- 2011
- Edition
- Softcover reprint of the original 1st ed. 1995
- Pages
- 372
- Language
- English
- Condition
- New
- Subject
- Crystallography
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