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Cover of Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs

by Ruijing Shen, Sheldon X. -D Tan, Hao Yu

Springer · 2012

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About this book

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs by Ruijing Shen, Sheldon X. -D Tan & others is a book published by Springer in 2012.

The book deals with Algorithms, Nanotechnology, Integrated circuits and Very large scale integration.

Book details

ISBN-13
9781461407874
ISBN-10
1461407877
Authors
Ruijing Shen, Sheldon X. -D Tan, Hao Yu
Publisher
Springer
Published
2012
Language
English
Condition
New
See all