Microstructure Science (v. 14)
Norman G. Einspruch
₹3,793
Nanometer Variation-Tolerant SRAM
Circuits and Statistical Design for Yield
by Mohab Anis, Mohamed Abu Rahma
Springer-Verlag New York Inc. · 2012
₹7,770
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About this book
Nanometer Variation-Tolerant SRAM: Circuits and Statistical Design for Yield by Mohab Anis & Mohamed Abu Rahma is a 172-page book published by Springer-Verlag New York Inc. in 2012.
Topics covered include Integrated circuits, Nanostructures, Computer storage devices and Random access memory.
Book details
- ISBN-13
- 9781461417484
- ISBN-10
- 1461417481
- Authors
- Mohab Anis, Mohamed Abu Rahma
- Publisher
- Springer-Verlag New York Inc.
- Published
- 2012
- Edition
- 2013
- Pages
- 172
- Language
- English
- Condition
- New
- Subject
- Integrated circuits
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