
The Boundary-Scan Handbook
Kenneth P. Parker
₹4,322

Circuits and Statistical Design for Yield
by Mohamed H. Abu-Rahma, Mohab Anis
Not Avail · 2013
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Nanometer Variation-Tolerant Sram: Circuits and Statistical Design for Yield is written by Mohamed H. Abu-Rahma & Mohab Anis. This edition from Not Avail (2013) has 175 pages.
The book deals with Systems engineering, Engineering, Computer-aided design and Circuits and Systems.