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Cover of Analog IC Reliability in Nanometer CMOS

Analog IC Reliability in Nanometer CMOS

by Elie Maricau, Georges Gielen

Springer-Verlag New York Inc. · 2013

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About this book

Analog IC Reliability in Nanometer CMOS is written by Elie Maricau & Georges Gielen. This edition from Springer-Verlag New York Inc. (2013) has 198 pages.

Topics covered include Linear integrated circuits, Systems engineering, Electronics and Integrated circuits.

Book details

ISBN-13
9781461461623
ISBN-10
1461461626
Authors
Elie Maricau, Georges Gielen
Published
2013
Edition
2013 ed.
Pages
198
Language
English
Condition
New
See all