Surface and Interface Characterization by Electron Optical Methods

Name: Surface and Interface Characterization by Electron Optical Methods: 16
Brand: Springer-Verlag New York Inc.
SKU: 9781461595397
Price: 4320.00 INR
Availability: InStock

by Ugo Valdre

Springer-Verlag New York Inc. · 2012 · Paperback

₹4,320

Free delivery. Nothing extra to pay at checkout.

Delivery in 3–7 days to any serviceable pincode in India, with tracking.
Cash on delivery. Pay when the parcel reaches you.
15-day returns. See what qualifies.

About this book

Surface and Interface Characterization by Electron Optical Methods: 16 by Ugo Valdre is a 319-page paperback edition published by Springer-Verlag New York Inc. in 2012.

The book deals with Electron microscopy, Surfaces (Physics), Technique and Congresses.