
Applied Scanning Probe Methods Ii
₹11,555

by Jen Gubicza
Idea Group,U.S. · 2014
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X-Ray Line Profile Analysis in Materials Science is written by Jen Gubicza. This edition is published by Idea Group,U.S. (2014). It belongs to the Research essentials series.
The book deals with Industrial Radiography, Materials, Testing and X-rays.
About the author: Jeno Gubicza (born 1969).